JEOL
JEOL products enable you to pursue a variety of R&D applications that require high resolution imaging and analytical capabilities such as: basic observation and analysis, environmental science, information technology, semiconductor production, biotechnology and nanotechnology.
Products include:
- Scanning Electron Microscopes
- Transmission Electron Microscopes
- Electron Probe X-ray Microanalysers
SEM's are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology...
The Transmission Electron Microscope — TEM — has been used in all areas of biological and biomedical investigations because of its...
The SPM is being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs,...
The Surface Analysis product line is comprised of three categories: Auger Microanalyzers, Electron Probe Microanalyzers (EPMA), and Photoelectron...
MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in...
JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. From Focused Ion Beam (FIB) systems for...
JEOL's newest SEM, the JSM-6010 delivers a research grade specification for the price of a benchtop SEM:
- Touch-screen...