Nanotechnology

CSM Instruments Indentation Testers

CSM Indentation Testers are high precision instruments used for the determination of mechanical properties of thin films, coatings and substrates...

CSM Instruments Scratch Testers

CSM Instruments Scratch Testers are dedicated instruments for characterizing the surface mechanical properties of thin films and coatings, e.g....

Gatan Analytical TEM

Transmission electron microscopy (TEM) resolves details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer...

Gatan Imaging

The Erlangshen™ family of lens-coupled CCD Cameras are work-horse systems designed to carry out a wide range of...

JEOL MultiBeam SEM-FIB

MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in...

JEOL Scanning Electron Microscopes

SEM's are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology...

JEOL Scanning Probe Microscopes

The SPM is being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs,...

JEOL Surface Analysis Instruments

The Surface Analysis product line is comprised of three categories: Auger Microanalyzers, Electron Probe Microanalyzers (EPMA), and Photoelectron...

JEOL Transmission Electron Microscopes

The Transmission Electron Microscope — TEM — has been used in all areas of biological and biomedical investigations because of its...