Gatan Analytical TEM

Transmission electron microscopy (TEM) resolves details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scales. Analytical TEM combines this high spatial resolution probe with the analytical capabilities of electron spectrometers, energy filters, and X-ray fluorescence systems to yield valuable compositional and structural information about specimens. 

In addition to its EELS and EFTEM product lines, Gatan also offers a variety of products to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, and spectral imaging and analysis software. 

• Dedicated EELS Spectrometer
• Post-Column TEM Energy Filters 
• Digital STEM Imaging 
• STEM Spectrum Imaging