JEOL's newest SEM, the JSM-6010 delivers a research grade specification for the price of a benchtop SEM:
Touch-screen control
4.0 nm SE resolution
8× to 300,000×
5-axis eucentric goniometer stage
150 mm dia × 48 mm high maximum sample size
Low and high vacuum modes
SE & BSE detectors
5120 × 3840 pixel image framestore
TMP vacuum system
<0.75 m2 footprint
A wide range of options and accessories are available, including a fully integrated EDS system with a 133 eV resolution, liquid nitrogen-free detector.
Model:
InTouchScope
Manufacturer:
JEOL (Electron Microscopy)
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