JEOL MultiBeam SEM-FIB

MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications. 

Products including:

  • JIB-4500
  •  JIB-4600F
Model: 
MultiBeam SEM-FIB
Manufacturer:
JEOL (Electron Microscopy)