JEOL Sample Preparation Equipment

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. From Focused Ion Beam (FIB) systems for nanometric specimens, to a benchtop cross section polisher for large area samples, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, and multi-layer structures.

For coating of non-conductive samples and forming carbon and various metal-deposited films, we offer an extremely clean vacuum evaporator. 

Products including:

• Cross Section Polisher: Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications
• Ion Slicer: Innovative specimen preparation for TEM / STEM / SEM / EPMA / AUGER
• Vacuum Evaporator: Clean, oil-free, automatic evacuation system for carbon coating of samples
• JEM-9320FIB: Gallium (Ga) liquid metal Focused Ion Beam system