JEOL Scanning Electron Microscopes

SEM's are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEM's. 

SEM products including:

High Vacuum/Low Vaccum

• JSM-6510
• JSM-6510LV
• JSM-6610
• JSM-6610LV
• JCM-5000 NeoScope
• JCM-5700 CarryScope™
• JASM-6200 ClairScope™

Analytical SEM

• JSM-6510A / 6510LA
• JSM-6610A / 6610LA

Conventional FE

• JSM-7001F

Semi-in-Lens FE

• JSM-6701F
• JSM-7500F
•  JSM-7600F