JEOL Scanning Probe Microscopes

The SPM is being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.  

SPM Products including:

• JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.
• JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
• JSPM-5400 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.