Anton Paar SAXSess High-Flux Small-Angle X-ray Scattering (SAXS) Instrument

The SAXSess is an instrument for structural characterization in the nanometer range. Due to the design of the SAXSess the X-ray intensity at the detector is very high and consequently measurement times are short. The use of an advanced CCD detector makes time-resolved SAXS experiments possible and results in a high sample throughput.

The SAXSess enables to perform simultaneous measurements up to scattering angles of 40° with the same excellent resolution as required for SAXS. No reassembly, no realignment nor intermediate handling of samples is necessary.